Quantitative détermination of aluminium and silicon in SiO2 and Al2O3 by X ray fluorescence
DOI:
https://doi.org/10.3989/mc.1966.v16.i123.1702Abstract
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Published
1966-09-30
How to Cite
Sagrera, J. L. (1966). Quantitative détermination of aluminium and silicon in SiO2 and Al2O3 by X ray fluorescence. Materiales De Construcción, 16(123), 23–30. https://doi.org/10.3989/mc.1966.v16.i123.1702
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Research Articles
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