SAGRERA, J. L. Quantitative détermination of aluminium and silicon in SiO2 and Al2O3 by X ray fluorescence. Materiales de Construcción, [S. l.], v. 16, n. 123, p. 23–30, 1966. DOI: 10.3989/mc.1966.v16.i123.1702. Disponível em: https://materconstrucc.revistas.csic.es/index.php/materconstrucc/article/view/1702. Acesso em: 2 may. 2024.